IPTeL Tracking ID: MPS-IAP-2017-043
The invention relates to the field of scanning probe microscopy, particularly to probe and actuator for high speed atomic force microscopy.
BACKGROUND
Atomic force microscopy (AFM) is a nano-scale imaging device to study various dynamic processes at nano-level using micro-cantilever probe. Conventional AFM has slow mode of operation leading to poor temporal resolution of captured image. Though piezoelectric actuators are used to increase the speed of imaging, they have creep and hysteresis as major limitations.
TECHNOLOGY
The present invention discloses a probe for high speed AFM and a cantilever with magnetic particle which increases actuation speed. The probe has additional advantages of reduced ohmic heating and maximized eigen-frequency.
COMMERCIALIZATION
IISc has filed an application for patent in Indian Patent Office for this invention. We are seeking for a commercial partner for licensing, collaboration and development of this technology